Voer een woord of zin in in een taal naar keuze 👆
Taal:
Vertaling en analyse van woorden door kunstmatige intelligentie ChatGPT
Op deze pagina kunt u een gedetailleerde analyse krijgen van een woord of zin, geproduceerd met behulp van de beste kunstmatige intelligentietechnologie tot nu toe:
- hoe het woord wordt gebruikt
- gebruiksfrequentie
- het wordt vaker gebruikt in mondelinge of schriftelijke toespraken
- opties voor woordvertaling
- Gebruiksvoorbeelden (meerdere zinnen met vertaling)
- etymologie
Wat (wie) is built-in test - definitie
TYPE OF MECHANISM THAT PERMITS A MACHINE OR ELECTRONIC COMPONENT TO TEST ITSELF
MBIST; Built-in test
Built-in self-test
A built-in self-test (BIST) or built-in test (BIT) is a mechanism that permits a machine to test itself. Engineers design BISTs to meet requirements such as:
Built-in test equipment
EQUIPMENT BUILT INTO AIRBORNE SYSTEMS TO SUPPORT MAINTENANCE PROCESSES
Built-In Test Equipment
Built-in test equipment (BITE) for avionics primarily refers to passive fault management and diagnosis equipment built into airborne systems to support maintenance processes. Built-in test equipment includes multimeters, oscilloscopes, discharge probes, and frequency generators that are provided as part of the system to enable testing and perform diagnostics.
PBIST
TYPE OF SELF-TEST
Programmable Built-In Self-Test
Programmable Built-In Self-Test (PBIST) is a memory DFT feature that incorporates all the required test systems into the chip itself. The test systems implemented on-chip are as follows:
Wikipedia
Built-in self-test
A built-in self-test (BIST) or built-in test (BIT) is a mechanism that permits a machine to test itself. Engineers design BISTs to meet requirements such as:
- high reliability
- lower repair cycle times
or constraints such as:
- limited technician accessibility
- cost of testing during manufacture
The main purpose of BIST is to reduce the complexity, and thereby decrease the cost and reduce reliance upon external (pattern-programmed) test equipment. BIST reduces cost in two ways:
- reduces test-cycle duration
- reduces the complexity of the test/probe setup, by reducing the number of I/O signals that must be driven/examined under tester control.
Both lead to a reduction in hourly charges for automated test equipment (ATE) service.
